Please use this identifier to cite or link to this item: http://sutir.sut.ac.th:8080/jspui/handle/123456789/10352
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dc.contributor.advisorWorawat Meevasanaen_US
dc.contributor.authorAreeya Mooltangen_US
dc.date.accessioned2025-09-10T04:11:05Z
dc.date.available2025-09-10T04:11:05Z
dc.date.issued2023
dc.identifier.urihttp://sutir.sut.ac.th:8080/jspui/handle/123456789/10352
dc.language.isoenen_US
dc.publisherSchool of Physics Institute of Science Suranaree University of Technologyen_US
dc.subjectFerroectric Property
dc.subjectFocus ion Beam (FIB)
dc.subjectElectron Beam Lithography (EBL)
dc.subjectPolarization
dc.titleFerroelectric study of nanoscale patterns on BiFeO3 thin filmsen_US
dc.title.alternativeการศึกษาคุณสมบัติเฟอร์โรอิเล็กทริกของลวดลายระดับนาโนเมตรของฟิล์มบางบิสมัทเฟอร์ไรต์en_US
dc.typeThesisen_US
dc.degree.nameDoctor of Philosophy
dc.degree.levelDoctoral Degree
dc.degree.disciplinePhysics
dc.degree.grantorSuranaree University of Technology
Appears in Collections:วิทยานิพนธ์ (Thesis)

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